|
|
Attend Anritsu's complimentary Techtime Tour seminar
in one of two remaining cities - Parsippany, NJ and Chelmsford, MA. |
|
|
|
|
|
|
Presented by Anritsu Company, the Techtime Tour is a complimentary full-day educational seminar focused on the applications of Vector Network Analyzers (VNAs). Material is presented by industry experts and includes both lecture and live demonstrations.
|
|
|
Locations / Dates
Santa Clara, CA - Tuesday, April 12 - COMPLETE!
Irvine, CA - Thursday, April 14 - COMPLETE!
Dallas, TX - Tuesday, May 3 - COMPLETE!
Austin, TX - Thursday, May 5 - COMPLETE!
Parsippany, NJ - Tuesday, May 17 - COMPLETE!
Chelmsford, MA - Thursday, May 19 at the Radisson Chelmsford-Lowell Schedule / Agenda
8:00 am - 9:00 am Check-In and Continental Breakfast
9:00 am - 10:15 am VNA Fundamentals Part I - System Architecture &
Measurements
10:15 am - 10:45 am Break
10:45 am - 12 noon VNA Fundamentals Part II - Calibration & Accuracy
12 noon - 1:00 pm Lunch Provided
1:00 pm - 2:45 pm Advanced Time Domain Techniques /
Amplifier Design &Test
2:45 pm - 3:15 pm Break
3:15 pm - 3:45 pm Device Characterization Demonstration
3:45 pm - 4:30pm Power Amplifier Design Inclusive of Load Pull Analysis
|
|
|
What topics are covered?
Vector Network Analyzer (VNA) Fundamentals
This session will cover the fundamentals of the VNA, one of the most versatile and flexible pieces of microwave instrumentation on the test bench. You will learn where and why VNAs are used; understand common terminology, explore system architectures, trade-off key component technologies, and review basic measurements. In addition, you will gain an appreciation for the importance of user calibration, the different calibration methods available, and how they, together with the instrument specifications, ultimately determine the measurement accuracies of the VNA. The session will close with a discussion of advanced measurements that go beyond the traditional S-Parameters.
Advanced Time Domain Techniques
This session will describe the various time domain methodologies including windowing, bandpass and low pass techniques. Application to a variety of situations will be described including identification of the location of mismatches, through cable defect location to determining the impedance levels in a cascaded series of transmission lines.
Advanced Amplifier Design and Test
The session will cover both linear and non-linear design and test with examples ranging from measurement of packaged amplifiers in a 50 ohm environment to characterization of both discrete transistors and on-wafer devices in a non-50 ohm environment. In addition to the more usual measurements such as gain, gain compression and harmonic testing, the session will included a discussion of non-linear amplifier design using load-pull techniques. The session will conclude with a live demonstration. Advanced Power Amplifier Design Inclusive of Load Pull Analysis
Power amplifier design presents unique challenges for simulation tools (as well as test & measurement equipment). Bridging real time hardware measurements with powerful simulation and design capabilities, AWR integrates with Anritsu for exchange of linear and nonlinear models - enabling design. modeling, and test engineers to be on cutting edge of RF/Wireless/ Signal Integrity designs.
This presentation describes how AWR's Microwave OfficeTM and Visual System SimulatorTM software capabilities allow engineers to focus on what is important -- the actual design of the PA itself. Topics covered include load pull, automatic EM simulation, harmonic balance simulation specific to PA circuits, constant output power and compression simulation, dynamic circuit probing, ERC checks, EVM / ACPR simulation as well as synergy with test & measurement equipment such as Anritsu's new VectorStar VNA. |
|
|
|
|
|
|
|
